smartctl 5.41 2011-06-09 r3365 [i686-linux-3.2.0-121-generic-pae] (local build)
Copyright (C) 2002-11 by Bruce Allen,
http://smartmontools.sourceforge.net=== START OF INFORMATION SECTION ===
Model Family: Hitachi Deskstar 7K1000.C
Device Model: Hitachi HDS721016CLA382
Serial Number: JP0121HM0BD08C
LU WWN Device Id: 5 000cca 35ac52d29
Firmware Version: JPEOA39C
User Capacity: 160 041 885 696 bytes [160 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: 8
ATA Standard is: ATA-8-ACS revision 4
Local Time is: Tue Feb 14 09:43:24 2017 MSK
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF ENABLE/DISABLE COMMANDS SECTION ===
SMART Enabled.
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x84) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 2197) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 37) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 016 Pre-fail Always - 0
2 Throughput_Performance 0x0005 124 124 054 Pre-fail Offline - 138
3 Spin_Up_Time 0x0007 123 123 024 Pre-fail Always - 184 (Average 189)
4 Start_Stop_Count 0x0012 099 099 000 Old_age Always - 7096
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 2
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 138 138 020 Pre-fail Offline - 31
9 Power_On_Hours 0x0012 098 098 000 Old_age Always - 16122
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 7071
192 Power-Off_Retract_Count 0x0032 095 095 000 Old_age Always - 7161
193 Load_Cycle_Count 0x0012 095 095 000 Old_age Always - 7161
194 Temperature_Celsius 0x0002 230 230 000 Old_age Always - 26 (Min/Max 10/51)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 2
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 8
SMART Error Log Version: 1
ATA Error Count: 2154 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 2154 occurred at disk power-on lifetime: 5056 hours (210 days + 16 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 06 f9 15 51 00 Error: ICRC, ABRT at LBA = 0x005115f9 = 5314041
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 08 40 ef 66 3d 40 08 43d+05:56:22.580 READ FPDMA QUEUED
60 40 38 f9 33 dc 40 08 43d+05:56:22.580 READ FPDMA QUEUED
61 80 30 ff 15 51 40 08 43d+05:56:22.578 WRITE FPDMA QUEUED
61 80 18 7f 15 51 40 08 43d+05:56:22.578 WRITE FPDMA QUEUED
60 08 08 d7 93 44 40 08 43d+05:56:22.578 READ FPDMA QUEUED
Error 2153 occurred at disk power-on lifetime: 4745 hours (197 days + 17 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 59 30 57 7b 0f 00 Error: ABRT at LBA = 0x000f7b57 = 1014615
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
29 00 80 07 7b 0f e0 00 13d+17:20:36.883 READ MULTIPLE EXT
25 00 80 07 7b 0f e0 00 13d+17:20:36.215 READ DMA EXT
25 00 10 ef 7a 0f e0 00 13d+17:20:36.209 READ DMA EXT
25 00 60 e7 79 0f e0 00 13d+17:20:36.176 READ DMA EXT
25 00 28 e7 d3 0d e0 00 13d+17:20:36.117 READ DMA EXT
Error 2152 occurred at disk power-on lifetime: 4745 hours (197 days + 17 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 59 30 57 7b 0f 00 Error: ABRT at LBA = 0x000f7b57 = 1014615
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
29 00 80 07 7b 0f e0 00 13d+17:20:36.883 READ MULTIPLE EXT
25 00 80 07 7b 0f e0 00 13d+17:20:36.215 READ DMA EXT
25 00 10 ef 7a 0f e0 00 13d+17:20:36.209 READ DMA EXT
25 00 60 e7 79 0f e0 00 13d+17:20:36.176 READ DMA EXT
25 00 28 e7 d3 0d e0 00 13d+17:20:36.117 READ DMA EXT
Error 2151 occurred at disk power-on lifetime: 4745 hours (197 days + 17 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 20 67 7b 0f 00 Error: ICRC, ABRT 32 sectors at LBA = 0x000f7b67 = 1014631
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 80 07 7b 0f e0 00 13d+17:20:36.215 READ DMA EXT
25 00 10 ef 7a 0f e0 00 13d+17:20:36.209 READ DMA EXT
25 00 60 e7 79 0f e0 00 13d+17:20:36.176 READ DMA EXT
25 00 28 e7 d3 0d e0 00 13d+17:20:36.117 READ DMA EXT
25 00 80 a7 ba 0d e0 00 13d+17:20:36.111 READ DMA EXT
Error 2150 occurred at disk power-on lifetime: 4745 hours (197 days + 17 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 59 28 ef f0 04 00 Error: ABRT at LBA = 0x0004f0ef = 323823
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
29 00 58 bf f0 04 e0 00 13d+17:20:34.794 READ MULTIPLE EXT
25 00 50 e7 57 05 e0 00 13d+17:20:34.645 READ DMA EXT
25 00 58 bf f0 04 e0 00 13d+17:20:33.880 READ DMA EXT
29 00 78 c7 ef 04 e0 00 13d+17:20:33.724 READ MULTIPLE EXT
35 00 20 bf 36 3c e0 00 13d+17:20:33.722 WRITE DMA EXT
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.